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A qualitative assessment of the accuracy for different de-embedding methods is presented in this paper. For the realization of this work, four procedures are analyzed. The open, short, open-short and multiline methods are applied to S-parameters measurements of four microstrip lines and dummy structures. The samples are fabricated on silicon substrate and have the same cross section, but differ in...
This brief presents the full characterization and modeling of uniform transmission lines on silicon. It includes the implementation of equivalent circuit models in both the frequency and time domains to perform accurate and causal simulations up to 30 GHz and for rise times in the order of picoseconds, respectively. These models can be directly implemented in SPICE-like simulators to obtain fast and...
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