Search results for: S. Danzeca
Microelectronics Reliability > 2017 > 76-77 > C > 640-643
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2054 - 2060
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2107 - 2114
IEEE Transactions on Nuclear Science > 2016 > 63 > 4-1 > 2168 - 2175
IEEE Transactions on Nuclear Science > 2016 > 63 > 4-1 > 2106 - 2114
Nuclear Inst. and Methods in Physics Research, A > 2014 > 745 > Complete > 73-81
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3458 - 3465
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3451 - 3457
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3424 - 3431
IEEE Transactions on Nuclear Science > 2013 > 60 > 4-1 > 2598 - 2604
IEEE Transactions on Nuclear Science > 2013 > 60 > 4-1 > 2435 - 2443