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Polycrystalline CuInSe2 (CIS) thin films ~100 nm thick were deposited using the co-evaporation method onto fused quartz substrates held at three different substrate temperatures (Ts): 450°C, 525°C, and 600°C. The films were characterized with spectroscopic ellipsometry (SE) both from the film side and through the glass. These SE data with both measurement geometries were analyzed together, based on...
Real time, in situ, and ex situ spectroscopic ellipsometry (SE) methods have been applied in systematic studies of the structure and optical properties of polycrystalline CdTe and CdS thin films deposited by rf magnetron sputtering. The goal of this ongoing research is to establish a basic understanding of the relationships between the physical and optical properties, including how the void fraction,...
This study focuses on the development of an optical property database through spectroscopic ellipsometry analysis of II–VI polycrystalline alloy thin films for tandem photovoltaics. The materials of interest for the active layer components in this application include top cell Cd1-xMgxTe and bottom cell HgxCd1-xTe. Such materials are being explored for use in current-matching two-terminal -- as well...
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