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Variations in the power-distribution network are exacerbated because of scaled supply voltages and smaller noise margins in sub-nanometer designs, which adversely affect performance and yield. Power-Supply noise incurred by excessive simultaneous switching of multiple paths negatively impacts the timing of a circuit. Supply noise is a major issue especially during transition and delay test where test...
Power supply noise is a critical issue in transition and delay testing. As compared to functional operations, test vectors induce increased switching. This escalation in switching contributes to an increase in power supply noise which, in turn, causes an increase in path delays. During testing, false positives due to excessive noise-induced failures negatively impacts yield. In our previous work,...
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