Search results for: Chen-Han Tsai
International Journal of Communication Systems > 28 > 1 > 187 - 200
IEEE Electron Device Letters > 2014 > 35 > 2 > 202 - 204
Microelectronic Engineering > 2013 > 105 > Complete > 40-45
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.1.1 - 5E.1.7
IEEE Transactions on Consumer Electronics > 2012 > 58 > 4 > 1329 - 1337
Microelectronic Engineering > 2011 > 88 > 7 > 1628-1632
2011 International Reliability Physics Symposium > MY.8.1 - MY.8.5
IEEE Electron Device Letters > 2011 > 32 > 11 > 1585 - 1587
IEEE Electron Device Letters > 2011 > 32 > 3 > 390 - 392
Journal of Microbiology > 2011 > 49 > 2 > 265-273
IEEE Journal of Solid-State Circuits > 2010 > 45 > 11 > 2321 - 2329