Search results for: A. D. Bouravleuv
Semiconductors > 2019 > 53 > 9 > 1187-1191
Semiconductors > 2018 > 52 > 16 > 2128-2131
Semiconductors > 2018 > 52 > 16 > 2117-2119
Semiconductors > 2018 > 52 > 12 > 1568-1572
Semiconductors > 2018 > 52 > 12 > 1529-1533
Semiconductors > 2018 > 52 > 12 > 1611-1615
Semiconductors > 2018 > 52 > 5 > 605-608
Semiconductors > 2018 > 52 > 1 > 19-23
Semiconductors > 2018 > 52 > 1 > 1-5
Technical Physics Letters > 2017 > 43 > 9 > 811-813
Semiconductors > 2016 > 50 > 12 > 1561-1565
Semiconductors > 2016 > 50 > 12 > 1619-1621
Semiconductors > 2016 > 50 > 12 > 1647-1650
Semiconductors > 2016 > 50 > 11 > 1421-1424
Technical Physics Letters > 2015 > 41 > 2 > 120-123
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques > 2014 > 8 > 1 > 104-110
Semiconductors > 2014 > 48 > 3 > 344-349
Semiconductors > 2013 > 47 > 10 > 1416-1421
Semiconductors > 2013 > 47 > 8 > 1037-1040