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From year to year there are lot of new requirements regarding to the lifetime and reliability of integrated circuits (IC) especially in automotive applications. In align with technology scaling the amount of device's reliability issues are increasing but the quality requirements becoming stronger. Now the aging phenomena becomes one of the critical issues in applications with longer life time. Hence...
In this paper is presented characterization and modeling of the self-heating effect (SHE) for multifinger MOSFET transistors. The mechanism of self heating effect has been analyzed based on simulator which supporting 2D device model. By using Verilog-A language a new model is developed for BSIM6 model which considers SHE effects as well. By using a vector network analyzer an AC conductance method...
Modern VLSI designs experience significant temperature change due to variations in workload and ambient conditions. The change in temperature can cause variation in other performance parameters such as power and reliability. Modern chips use complex self-calibration techniques to adjust design parameters to safeguard the chip's operation against temperature fluctuations. Any on-chip self-calibration...
A novel process corner detection circuit has been proposed in current work. The circuit uses only metal-oxide-semiconductor (MOS) transistors to precisely detect process corner. Such approach allows reducing circuit's area and current consumption. Information on corner is represented in digital form (code), which allows easily using the digital signal for both testing and compensation of process variation...
A new process variation monitoring circuit (PVMC) has been proposed in the paper. The goal is to generate a digital signal/code which (code value) will characterize the process corner. The circuit uses only metal-oxide-semiconductor (MOS) transistors to detect variation of their parameters, or process corner by generating digital signals. Process variation is detected based on variation of parameters...
In this paper a new approach for on chip compensation of resistor value which can change due to process and temperature variations is presented. There is a special circuit which generates three bits for compensation corresponding to the variation of termination resistor value. The generated bits connect compensation resistors to termination resistor in parallel and in series through demultiplexor...
A novel approach for process variation detection (PVD) is proposed. Named "dynamic measurement", the proposed method is able to detect process corner type. Information on process variability is represented in digital signal (code). Use of such approach can exclude necessity of use of special measurement equipment or embedded test structures (ring oscillators, transistor arrays, etc.) during...
This paper addresses a new approach for low jitter, low power phase locked loop design. Effects of process-voltage-temperature variation on PLL are studied. A self compensating PLL solution using process-voltage-temperature variation effects compensation method, based on external reference clock signal is presented. The proposed solution shows considerable improvement of frequency stability and power...
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