Search results for: M. S. Dunaevskiy
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques > 2019 > 13 > 3 > 395-399
Semiconductors > 2018 > 52 > 16 > 2046-2048
Semiconductors > 2018 > 52 > 14 > 1833-1835
Semiconductors > 2018 > 52 > 14 > 1882-1885
Semiconductors > 2018 > 52 > 12 > 1611-1615
Semiconductors > 2018 > 52 > 5 > 609-611
Semiconductors > 2017 > 51 > 8 > 1072-1080