Search results for: Heng-Yuan Lee
Nanoscale Research Letters > 2017 > 12 > 1 > 1-6
IEEE Journal of the Electron Devices Society > 2015 > 3 > 4 > 377 - 381
2015 IEEE International Reliability Physics Symposium > MY.7.1 - MY.7.6
Solid State Electronics > 2014 > 94 > Complete > 1-5
IEEE Transactions on Nanotechnology > 2014 > 13 > 3 > 409 - 417
IEEE Electron Device Letters > 2014 > 35 > 2 > 202 - 204
Microelectronic Engineering > 2013 > 112 > Complete > 157-162
Surface and Coatings Technology > 2013 > 231 > C > 563-566
Microelectronic Engineering > 2013 > 105 > Complete > 40-45
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.1.1 - 5E.1.7