Search results for: Friedrich Peter Leisenberger
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1250 - 1260
Journal of Electronic Testing > 2016 > 32 > 4 > 447-458
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1250 - 1260
Journal of Electronic Testing > 2016 > 32 > 4 > 447-458