Search results for: Seung Ki Joo
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 432 - 437
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 82 - 85
IEEE Electron Device Letters > 2008 > 29 > 3 > 232 - 234
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1420 - 1424
IEEE Transactions on Electron Devices > 2007 > 54 > 9 > 2546 - 2550