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Thin films of ZnO were deposited on cleaned soda lime glass substrates by using RF magnetron sputtering technique for deposition time of 20mins, 40mins, 60mins, 80mins and 100mins at room temperature. The structural and electrical properties of ZnO thin films were obtained from X-ray diffraction (XRD), Atomic force microscopy (AFM) and Hall Effect measurement. XRD results confirm the presence of (002)...