Search results for: Ming-Han Lee
Journal of Synchrotron Radiation > 28 > 4 > 1202 - 1209
IEEE Access > 2016 > 4 > 2256 - 2271
Microelectronics Reliability > 2008 > 48 > 10 > 1724-1733
Journal of Synchrotron Radiation > 28 > 4 > 1202 - 1209
IEEE Access > 2016 > 4 > 2256 - 2271
Microelectronics Reliability > 2008 > 48 > 10 > 1724-1733