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Long term morphological and structural changes of ZnxCd1−xSe (x=0.4, 0.6 and 0.8) thin films, obtained by solid state alloying of consecutively deposited submonolayers of ZnSe and CdSe, were investigated by means of Atomic Force Microscopy (AFM) and X-ray diffraction (XRD). The XRD investigations show typical solid solution patterns without any decomposition. A relaxation of the lattice is observed...