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Electromagnetic (EM) waves have been recently pointed out as a medium for fault injection within integrated circuits (IC). Indeed, it has been experimentally demonstrated that an EM pulse (EMP), produced with a high-voltage pulse generator and an injector similar to that used to perform EM analyses, was susceptible to create faults exploitable from a cryptanalysis viewpoint. An analysis of the induced...
EM injection recently emerged as an effectivemedium for fault injection. This paper presents an analysisof the IC susceptibility to EM pulses. It highlights that faultsproduced by EM pulse injection are not timing faults butcorrespond to a different model which is presented in thispaper. This model also allows to explain experimental resultsintroduced in former communications.
This paper discusses the need for on-chip correction of mixed-signal integrated circuits, and particularly Analog-to-Digital Converters (ADCs), for in-situ adaptation to the operating conditions. By operating conditions, we mean the environmental conditions and the electrical settings applied to the ADC by the complex system in which it is implemented. This discussion is supported by experimental...
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