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An adjustable spark gap structure is designed to generate Secondary ESD. The primary and the secondary discharge current are directly measured. The setup is modelled using CST full-wave simulation software. The goal is to predict secondary ESD induced current levels using simulation methods, to assist designers in product development in the early design stage.
Different real world scenarios which may cause stress voltages on USB connected devices are investigated. This study identifies ESD discharge scenarios and their respective current and voltage levels, stress duration and the rise times for different USB cable shield types.
This paper reports on an investigation of ESD stresses on a fingerprint module. It shows that sparking to the flex connector, dielectric breakdown of the insulating layers, and transient electric and magnetic fields can cause damage. Test methods and simulation models are shown. An ESD generator and ESD field probe were used to expose the fingerprint module to currents and electromagnetic fields....
A USB cable can be triboelectrically charged by rubbing it against a piece of clothing, such as a sweater. If a charged cable is inserted into a connector, an ESD event can upset or damage attached equipment. To investigate charge levels and estimate the resulting voltages on a USB cable, a set of experiments has been performed in a climate chamber under five different environmental conditions. These...
When an ESD (electrostatic discharge) event reaches a non-grounded metallic part within a product, the voltage of this metal part with respect to ground will increase. If the isolation to ground is insufficient, a secondary ESD event can occur. As secondary ESD often leads to system upset or damage, and to poorly-reproducible results, it is important to detect the occurrence of secondary ESD. If the...
ESD to a display may upset or damage the display or the touch circuit. The ESD may have a visible spark carrying current to the frame of the mobile device, to the connecting flex cable, or into the display by penetrating the glue between the glass layers. It may also be a sparkless ESD that causes corona charging on the surface of the glass having currents as high as 10 A. A measurement technique...
During the IEC 61000-4-2 test the DUT is placed on a 0.5 mm insulating sheet, which is on the horizontal coupling plane (HCP). For discharge points on the back side of the phone this leads to a situation in which the display is facing the HCP. The phone or tablet forms a capacitance between 50 pF and 300 pF to the HCP. The capacitance value depends on the size of the phone, its screen flatness, and...
A frequency-tunable resonant magnetic field probe is designed for near-field scanning applications for the radio frequency interference studies. Tunable resonance is achieved by using a varactor diode providing the required capacitance and the parasitic inductance of a magnetic loop (i.e., a parallel LC circuit). An equivalent circuit model for the probe is described, analyzed, and used for designing...
EMI scanning application requires phase and magnitude information for the creation of equivalent radiation models and for far-field prediction. Magnitude information can be obtained using rather an inexpensive spectrum analyzer (SA). Phase-resolving instruments such as vector network analyzers (VNA) or oscilloscopes are very expensive for frequencies above 5 GHz. For this reason, this paper proposes...
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