Search results for: S. Mitra
Electronics Letters > 2016 > 52 > 1 > 36 - 37
IEEE Transactions on Reliability > 2015 > 64 > 1 > 473 - 485
Electronics Letters > 2016 > 52 > 1 > 36 - 37
IEEE Transactions on Reliability > 2015 > 64 > 1 > 473 - 485