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The cost and the package size driven size reduction of semiconductors lead to much higher heat generation. Also the use of new high power technologies on the basis of SiC produces is a need for high conductivity of the interconnect materials. Therefore the requirements for mechanical, thermal and electrical properties of interconnect materials increase compared to existing eutectic solder and glue...
Within this paper, we present a guideline for the mechanical acceleration of reliability experiments for end-of-lifetime prognostics of metal based die attach materials. First, we used an advanced hybrid nano-effect sintered silver layer as interface between die and substrate which has very good electrical and thermal conductivities. Two pairs ofexperiment/simulation are scheduled. An isothermal mechanical...
Through encapsulant vias (TEVs) are an interconnect technology which enables 3D stacking and double sided re-routing of packages encapsulated with epoxy molding compound. These interconnects are formed by Cu-plated holes through the encapsulant and can typically be routed by an RDL (redistribution layer). In order to enable prolonged function of these interconnects, thermo-mechanical reliability has...
Abstract Through encapsulant vias (TEVs) are an interconnect technology which enables 3D stacking and double sided re-routing of packages encapsulated with epoxy molding compound. These interconnects are formed by Cu-plated holes through the encapsulant and can typically be routed by an RDL (redistribution layer). In order to enable prolonged function of these interconnects, thermomechanical reliability...
Silicon front-end and assembly and packaging technology more and more merge. In addition interconnect density reaches limits for advanced CMOS technology. In this paper we introduce the fan-out embedded wafer level packaging technology, which is an example to link front-end and packaging technology and offers additional freedom for interconnect design. We demonstrate capabilites for system integration...
We present a comparison of flip chip and wirebond first level interconnects used in a leadless plastic package with respect to high frequency performance. We apply numerical analysis and experimental measurements on high frequency devices. We show that flip chip interconnects provide superior electrical performance compared to wirebonds. This is demonstrated by reduced losses and less parasitic effects
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