Search results for: Javier A. Salcedo
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 263 - 265
IEEE Transactions on Electron Devices > 2007 > 54 > 4 > 822 - 832
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 263 - 265
IEEE Transactions on Electron Devices > 2007 > 54 > 4 > 822 - 832