Search results for: S. Tyaginov
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-10.1 - XT-10.6
Microelectronics Reliability > 2015 > 55 > 9-10 > 1427-1432
2015 IEEE International Reliability Physics Symposium > 3B.5.1 - 3B.5.6
2012 International Electron Devices Meeting > 30.5.1 - 30.5.4
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.7.1 - XT.7.6
Microelectronics Reliability > 2011 > 51 > 9-11 > 1525-1529