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Study of diffusion mechanism in low-temperature bonding method based on Cu microcones is reported. A Sn layer was electrodeposited on the Cu microcones and the electrodeposited Cu substrate then annealing at bonding temperature 463 K. IMC grains of Sn/Cu-microcones diffusion samples grew slow with smaller size. The special morphology of Cu microcones was beneficial for the growth of intermetallic...
Electroless Sn films have great potential in the lead-free age such as for high-density, fine-pitch, narrow soldering pad and bump interconnection applications. In the present work, electroless Sn were deposited onto lead-frame alloys (C194 and FeNi42). The microstructures of the electroless Sn films and tin whisker growth in thermal / humiditive chamber were investigated with scanning electron microscope...
The oxidation behavior of Sn-9Zn-3Bi-xCr(x=0, 0.1, 0.3, 0.5) solders under 250°C has been investigated as a function of exposure time. The evolution of surface and cross-sectional microstructure has been examined through back-scattered electron detector (BSE). Energy-dispersive x-ray spectroscopy (EDX) and x-ray diffractometer analysis (XRD) were also carried out to check the overall composition of...
Electroplating matte Sn has attracted much attention in the lead-free age. To prevent a growth of tin whiskers from lead-frame supported matte tin films, various mitigation methods have been reported. In this work, pure matte Sn was electroplated onto C194 alloy, and electroplating Ni film was used as barrier between matte Sn and lead-frame alloy. The microstructures of the Ni/Sn depositions and tin...
Electroplating Sn plays an important role in the lead-free age because of its excellent solderability and many other advantages. In this work, bright Sn was electroplated onto both C194 and FeNi42 alloys. The plating parameters, substrate effect, barrier layer effect and IMC formation were investigated through detailed microstructural characterization of the Sn films, barrier layers and cross-sections...
The interfacial reaction between OSP, electrolytic Ni/Au, and electroless Ni/Pd/Au surface finish and SnAgCu solder on BGA package were investigated. After multiple reflows, IMC morphology and composition is examined by SEM and EDX. Cu6Sn5 formed between LF35 and OSP finish, and Ag3Sn were found disperse in the solder. Both (Nix,Cu1-x)3Sn4 and (Cux,Ni1-x)6Sn5 were observed on interface of electrolytic...
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