Search results for: Qing Wan
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 2 > 121 - 125
IEEE Electron Device Letters > 2017 > 38 > 4 > 525 - 528
IEEE Electron Device Letters > 2017 > 38 > 3 > 322 - 325
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3958 - 3963
IEEE Electron Device Letters > 2016 > 37 > 5 > 591 - 594
IEEE Electron Device Letters > 2016 > 37 > 3 > 287 - 290
IEEE Electron Device Letters > 2016 > 37 > 3 > 299 - 302
IEEE Electron Device Letters > 2016 > 37 > 6 > 778 - 781
IEEE Electron Device Letters > 2015 > 36 > 12 > 1271 - 1273
IEEE Electron Device Letters > 2015 > 36 > 2 > 198 - 200
IEEE Electron Device Letters > 2015 > 36 > 2 > 204 - 206
IEEE Electron Device Letters > 2014 > 35 > 6 > 672 - 674
IEEE Electron Device Letters > 2014 > 35 > 8 > 838 - 840
IEEE Electron Device Letters > 2014 > 35 > 4 > 482 - 484
IEEE Electron Device Letters > 2014 > 35 > 3 > 414 - 416
IEEE Electron Device Letters > 2014 > 35 > 2 > 280 - 282
IEEE Electron Device Letters > 2013 > 34 > 11 > 1433 - 1435
IEEE Electron Device Letters > 2013 > 34 > 2 > 259 - 261
IEEE Electron Device Letters > 2013 > 34 > 2 > 265 - 267