Search results for: Albin Bayerl
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3118 - 3124
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 495 - 501
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3118 - 3124
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 495 - 501