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A successful approach to drastically reduce or even completely eliminate friction and wear in scanning force microscopy is the use of electrostatic modulation of the normal force acting on the tip-sample contact. In this paper we have devised, fabricated and experimentally characterized a novel electrostatically actuated AFM probe. The probe consists of a flexible cantilever that has an electrostatic...
A novel trench-type anti-wear microprobe with nano-scale electric contacts was proposed as an AFM probe to overcome the problem of probe tip wear and improve patterning stability in Atomic force microscope (AFM) local anodic oxidation (LAO) lithography. The proposed microprobe was fabricated using MEMS technique. The patterning and wear properties of the fabricated microprobe in AFM LAO lithography...
We present a process for batch fabrication of a novel scanning microscopy probe for thermal and magnetic imaging using standard micromachining and conventional optical contact lithography. The probe features an AFM-type cantilever with a sharp pyramidal tip composed of four freestanding silicon nitride nanowires coated by conductive material. The nanowires form an electrical cross junction at the...
Molecular biophysicists seek to understand how biological systems work through mechanical or electrical characterizations performed at the molecular scale. From this perspective, we have devised a silicon-based micromechanical tool for stress-strain measurements of molecular fibers and demonstrated micro manipulation and biomechanical characterization of DNA bundles in a liquid solution. By combining...
We have newly observed the gold atom migration and rearrangement at the artificially made point contact in a well controlled manner using microactuated probes with nano positioning accuracy. In-situ TEM observation revealed that the initial gold facet before contact strongly influences the shape of a nanobridge during the tensile test. Crystallographic facets of (211 macr), (101 macr) and (110 macr)...
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