Search results for: Artur Pogiel
Journal of Electronic Testing > 2011 > 27 > 5 > 599-609
2010 15th IEEE European Test Symposium > 221 - 226
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2007 > 26 > 8 > 1478 - 1494
Journal of Electronic Testing > 2007 > 23 > 1 > 35-45