Search results for: Kin P. Cheung
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1489 - 1497
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3851 - 3856
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3605 - 3613
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 769 - 775
IEEE Electron Device Letters > 2015 > 36 > 1 > 20 - 22
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 972 - 977
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2509 - 2514
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3613 - 3618
2012 IEEE International Reliability Physics Symposium (IRPS) > GD.1.1 - GD.1.3
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 2943 - 2949