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In ADC BIST testing circuit, ramp signal is the most widely used stimulus because of its simple structure and ease of control. In addition, with SEIR algorithm, the linearity requirement of the ramp signal is highly relaxed. But for high resolution ADC BIST testing, the ramp signal must be repetitive for acquiring valid data because a single ramp will cost large area, which is not acceptable for BIST...
Linearity and spectral performance test contributes most cost of ADC test. This paper presents a new method for testing an ADC's SNR from its linearity test data. The method does not require additional data acquisition or accurate sinusoidal stimulus. Data collected for linearity test is used to compute the input noise power and test ADC's SNR. Both simulation and experimental results show that the...
Coherent sampling is required in ADC testing. Unlike production testing in which fractional frequency is available, only sampling clock of ADC is available for ADC Built-in Self-test (BIST). Triangular stimulus generator controlled by sampling clock of ADC cannot provide enough information because same voltages are sampled in every period. To carry out valid data acquisition, different voltages in...
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