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Cross-correlation analysis of the cyclostationary near-field unintentional radiations from the printed circuit boards (PCB) can be used for the localization of the transmission line paths transferring the deliberately programmed pseudorandom sequences. The unintentional radiations are formed by induced surface currents on the surface of the PCB and can be measured by the near-field magnetic probes...
In this paper a 2D parametric identification algorithm of stochastic electromagnetic interference (EMI) sources based on near-field measurements is presented. The unintentional radiation of electronic devices and connecting cables can be measured by using two-point near-field planar scanning probes connected to the digital oscilloscope for ultra-wideband (UWB) time-domain data recording. The characterization...
We have extended the method for modeling the stochastic EM near-field which has already been described in [5, 13] for stationary stochastic fields to the case of cyclostationary fields. Areas of application are the modeling of the electromagnetic interference radiated by digital circuitry inside the system and also into the environment, where the period of the cyclostationary EMI is given by the clock...
Second order CS stochastic processes are non-stationary stochastic processes, where the TDCM depends on the global time and the time difference, and the dependence on the global time is periodic. This autocorrelation function can be represented by a 2D cyclic correlation spectrum containing delta functions at frequencies multiple to the cycle frequency of the stochastic process. Accordingly a CS stochastic...
The near-field measurements of the stochastic fields radiating by digital electronic devices can be used for the localization of the stochastic electromagnetic interference (EMI) sources on the surface of device under test. The characterization of the space distribution for the wide sense cyclostationary (WSCS) stochastic field in the observation plane can be accomplished by a cross correlation between...
In this paper a 2D stochastic EMI source identification algorithm based on time domain measurements of electromagnetic near-field tangential components is presented. The radiating structure is considered as a set of simple electrical dipoles arranged on grid in the object plane. The autocorrelation and cross-correlation spectra are used for the characterization of stochastic field distribution. These...
In this paper a 2D stochastic EMI sources identification algorithm based on two-point time-domain scanning of electromagnetic near-field tangential components is presented. The radiating structure is considered as a set of simple electrical dipoles arranged on a grid in object plane. The autocorrelation and cross-correlation spectra are used for the characterization of stochastic field distribution...
The paper presents a planar stochastic EMI sources localization approach based on two-point time-domain data of electromagnetic near-field tangential components. The radiating structure is considered as a set of simple electrical dipoles arranged on a grid in the object plane. The autocorrelation and cross-correlation spectra of eradiated signals in two different space points are used to determine...
The near-field measurement is one of the widely used methods of complex device electromagnetic compatibility (EMC) analysis. The device radiation pattern can be calculated directly using the near-field measurement or after the reconstruction of equivalent dipole model in the object plane [1]. In accordance with equivalence principle the dipole model parameters completely determine the current distribution...
Localization algorithm for stochastic EMI sources based on time domain planar near-field scanning of tangential electromagnetic field components emitted by a complex radiated structure is presented. The main theory aspects of the field reconstruction in the object plane as well as the main limitations for scanning parameters are also discussed for the proposed localization procedure. The autocorrelation...
A localization technique for stochastic EMI sources based on time domain measurements of EM near-field tangential components is presented. The autocorrelation and cross-correlation functions obtained by using the two-point planar scanning system are used for the characterization of stochastic field distribution. The main limitations for scanning parameters are discussed. The case study for a frequency...
This paper presents equivalent network synthesis techniques for microwave structures. The band limited scattering parameters obtained by measurement or by full wave simulation was used for the network synthesis. This data could be represented by the transfer function of an equivalent circuit containing lumped elements (capacitors, inductances and resistances). The proposed approach is based on the...
The paper suggests network synthesis algorithm used limited band scattering parameters of microwave devices. The proposed approach is based on the simple description of the microwave structures using lumped element network. The submitted example of synthesis illustrates the microstrip filter design.
The modeling of passive microwave structures by equivalent circuit models is an efficient technique which allows to include distributed problems into complex modeling environments at a system level. However, when synthesizing lumped element circuits for electromagnetic structures with large internal propagation delays, the obtained impedance functions exhibit a large number of frequency poles in a...
The information about shape and geometrical dimensions of the moving target can be extracted using Doppler spectrum. The short observation time interval corresponds to constant speeds of target scatterers as well as low resolution by Doppler frequency shift. Methods of spectral estimation are applied to identify the scatterer parameters. Two methods of a target Doppler spectrum model order selection...
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