Search results for: Joseph B. Bernstein
Microelectronics Reliability > 2017 > 68 > C > 91-97
Microelectronic Engineering > 2013 > 103 > Complete > 70-75
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2013 > 3 > 8 > 1263 - 1270
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2012 > 2 > 5 > 748 - 755
IEEE Transactions on Reliability > 2011 > 60 > 3 > 622 - 639
IEEE Instrumentation & Measurement Magazine > 2011 > 14 > 1 > 24 - 31
Precision Engineering > 2010 > 34 > 3 > 578-585
Microelectronics Reliability > 2009 > 49 > 12 > 1546-1554
Microelectronics Reliability > 2009 > 49 > 12 > 1563-1572
Microelectronics Reliability > 2006 > 46 > 12 > 1957-1979