Search results for: Yukiya Miura
IEEJ Transactions on Electrical and Electronic Engineering > 15 > 10 > 1475 - 1481
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 11 > 3282 - 3295
2010 15th IEEE European Test Symposium > 107 - 111
Journal of Electronic Testing > 2008 > 24 > 1-3 > 223-233
Journal of Electronic Testing > 2006 > 22 > 4-6 > 411-423
Journal of Electronic Testing > 2002 > 18 > 2 > 109-120
Journal of Electronic Testing > 1999 > 14 > 1-2 > 39-48