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We present the optimum operating conditions for THz scattering-type near-field microscopes using a self-consistent quasi-static line dipole image method. We show that the optimum incident angle of THz wave depends on the complex refractive index of substrate, and significantly enhance the near-field scattering signal. We also find that forward-scattering signal is preferred to back-scattering signal...
Combined with THz time-domain spectroscopy, THz near-field microscopy based on an atomic force microscope is a technique that, while challenging to implement, is invaluable for probing low-energy light-matter interactions of solid-state and biomolecular nanostructures, which are usually embedded in background media. Here, we experimentally demonstrate a broadband THz pulse near-field microscope that...
We measured terahertz (THz) emission from the vertically aligned indium arsenide (InAs) nanowires using THz time-domain spectroscopy. The photoexcited InAs nanowires were grown by metalorganic chemical vapor deposition on type <111> silicon substrate. Experimental results shows that THz emission mechanism of InAs nanowires are very different from that of bulk InAs substrates.
We present a THz scattering-type scanning near-field optical microscope (THz s-SNOM) system. To estimate pure material resolution of our THz s-SNOM system, near-field images were obtained for embedded metallic grating. The pure material resolution of our THz s-SNOM system was estimated to be less than 100 nm.
We present the analysis and measurements of scattering signals of a terahertz pulse scattering-type near-field microscope. We used a self-consistent line dipole image method for the quantitative analysis of the THz near-field interaction. The line scan across a gold film demonstrated that the terahertz miscroscope has a nanoscale resolution of nm. The measurements of scattering...
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