Search results for: Kazuteru Namba
IEEE Transactions on Computers > 2016 > 65 > 12 > 3794 - 3801
IEEE Transactions on Multi-Scale Computing Systems > 2016 > 2 > 4 > 291 - 296
IEEE Transactions on Computers > 2016 > 65 > 6 > 2005 - 2009
IEEE Transactions on Computers > 2016 > 65 > 3 > 781 - 790
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 30 - 37
IEEE Transactions on Computers > 2015 > 64 > 10 > 2902 - 2911
IEEE Transactions on Computers > 2015 > 64 > 7 > 2092 - 2097
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 75 - 81
IEEE Transactions on Nanotechnology > 2014 > 13 > 5 > 905 - 916
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 664 - 671
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 112 - 120
IEEE Access > 2013 > 1 > 758 - 769
Journal of Electronic Testing > 2013 > 29 > 4 > 545-554
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 5 > 804 - 817
IEEE Transactions on Computers > 2011 > 60 > 10 > 1459 - 1470
Journal of Electronic Testing > 2010 > 26 > 6 > 667-677
Journal of Electronic Testing > 2009 > 25 > 1 > 97-105
Journal of Electronic Testing > 2008 > 24 > 1-3 > 11-19