Search results for: Kentaroh Katoh
2014 International SoC Design Conference (ISOCC) > 104 - 105
Journal of Electronic Testing > 2014 > 30 > 6 > 653-663
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 5 > 804 - 817
2014 International SoC Design Conference (ISOCC) > 104 - 105
Journal of Electronic Testing > 2014 > 30 > 6 > 653-663
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 5 > 804 - 817