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Application of Photon Emission Microscopy (PEM) in semiconductor characterization often shows a linear dependence between emission intensity and biasing current. However, inconclusive understanding of photon emission phenomena in Silicon stopped the research community form applying PEM for local current estimation. In this paper we show for the first time that the linear relationship is valid for...
The optical spectra of yeast cells in phosphate buffer saline (PBS) were analyzed with an optical UV-vis sensor based on a shallow p+n junction realized in a low doped n-type epitaxial silicon layer grown on a strongly doped n+ substrate. The presence of the n/n+ interface allows a significantly enhanced sensitivity, due to an increased collection of carriers photogenerated both by short and large...
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