Search results for: Steven Thijs
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3424 - 3431
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 104 - 111
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 4 > 589 - 598
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 338 - 346