Search results for: T. Kimoto
Journal of Electronic Materials > 2017 > 46 > 11 > 6411-6417
Journal of Crystal Growth > 2017 > 468 > C > 889-893
2017 IEEE International Reliability Physics Symposium (IRPS) > 2A-1.1 - 2A-1.7
Superlattices and Microstructures > 2016 > 99 > C > 151-157
Environmental Pollution > 2016 > 218 > C > 289-296
Advanced Texts in Physics > Silicon Carbide > Processing > 711-733
2014 IEEE International Electron Devices Meeting > 2.5.1 - 2.5.4
Physica C: Superconductivity and its applications > 2013 > 484 > Complete > 295-299
IEEE Transactions on Applied Superconductivity > 2012 > 22 > 3 > 4302004
Physica C: Superconductivity > 2011 > 471 > 21-22 > 1454-1458
Microelectronics Reliability > 2011 > 51 > 9-11 > 1773-1777
Silicon Carbide > MOS Interfaces > 215 - 233
IEEE Electron Device Letters > 2011 > 32 > 3 > 285 - 287
Physica C: Superconductivity > 2010 > 470 > 20 > 1860-1864