Search results for: Hu-Seung Lee
Journal of the Korean Physical Society > 2019 > 74 > 11 > 1079-1084
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 604 - 609
Journal of the Korean Physical Society > 2019 > 74 > 11 > 1079-1084
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 604 - 609