Search results for: Daoguo Yang
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2807 - 2814
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 478 - 485
Microelectronics Reliability > 2015 > 55 > 9-10 > 1877-1881
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 220 - 228