Search results for: C Sturm
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 243 - 254
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 255 - 262
2011 International Reliability Physics Symposium > 2E.3.1 - 2E.3.5
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2924 - 2927