Search results for: Sheldon X.-D. Tan
Integration, the VLSI Journal > 2018 > 60 > C > 132-152
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 653 - 666
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 9 > 2561 - 2574
Integration, the VLSI Journal > 2017 > 58 > C > 518-527
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 11 > 1848 - 1861
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 11 > 1811 - 1824
IEEE Design & Test > 2016 > 33 > 5 > 56 - 64
Integration, the VLSI Journal > 2016 > 55 > C > 307-315