The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
For reducing the test application time and required tester pins per device, we propose the use of multi-valued logic (MVL) signals, which increases data rate between the device under test (DUT) and automatic test equipment (ATE). An MVL signal sends multiple bits of information per clock cycle on a physical channel. Conversion of signals between binary and MVL is accomplished by digital to analog...
With the reduced-pin-count test (RPCT) being adopted for multi-core systems-on-chip (SoCs) that usually support test compression as well, test speed is reduced due to the narrower input bandwidth. In this work, we propose an idea to combine multi-valued logic (MVL) test application with RPCT technology, which increases the data rate of test channels to avoid compromising test speed for the interface...
The reduced pin-count test (RPCT) has been proposed for testing cost reduction in various scenarios like scan, test compression and multi-site test. In this paper, we propose a new RPCT technique in which several digital signals are combined into a single multi-valued logic (MVL) signal. Mixed-signal components, digital-to-analog and analogto- digital converters, are used to compress the tester channels...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.