Search results for: A F Witulski
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 471 - 476
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 382 - 387
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2098 - 2106
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2122 - 2128
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 3064 - 3071
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2650 - 2656
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3163 - 3170
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4368 - 4373
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4470 - 4475
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4394 - 4398
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4498 - 4504
Journal of Electronic Testing > 2012 > 28 > 6 > 877-883
2011 International Reliability Physics Symposium > 3C.5.1 - 3C.5.6
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 885 - 890
IEEE Transactions on Aerospace and Electronic Systems > 2010 > 46 > 2 > 761 - 770