Search results for: Yi-Ren Pan
Computer-Aided Design > 2011 > 43 > 6 > 612-628
IEEE Transactions on Semiconductor Manufacturing > 2011 > 24 > 1 > 27 - 43
International Journal of Robust and Nonlinear Control > 20 > 10 > 1176 - 1196
Computer-Aided Design > 2011 > 43 > 6 > 612-628
IEEE Transactions on Semiconductor Manufacturing > 2011 > 24 > 1 > 27 - 43
International Journal of Robust and Nonlinear Control > 20 > 10 > 1176 - 1196