Search results for: E Simoen
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > Characterization and Simulation of SOI Devices Operating under Harsh Environment > 255-260
NATO Science Series II: Mathematics, Physics and Chemistry > Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices > Noise in Nanoscale Devices > 129-136
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > Radiation Effects > 221-226
NATO Science Series II: Mathematics, Physics and Chemistry > Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices > Noise in Nanoscale Devices > 121-128
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Diagnostics of the SOI Devices > 267-286
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Diagnostics of the SOI Devices > 287-306
Radiophysics and Quantum Electronics > 2009 > 52 > 9 > 655-670
Journal of Materials Science: Materials in Electronics > 2008 > 19 > 2 > 175-178
Journal of Materials Science: Materials in Electronics > 2008 > 19 > 2 > 161-165
Journal of Materials Science: Materials in Electronics > 2008 > 19 > 2 > 171-173
Journal of Materials Science: Materials in Electronics > 2007 > 18 > 7 > 705-710
Journal of Materials Science: Materials in Electronics > 2007 > 18 > 7 > 799-804
Journal of Materials Science: Materials in Electronics > 2005 > 16 > 7 > 455-458
Journal of Materials Science: Materials in Electronics > 2005 > 16 > 7 > 459-462
Journal of Materials Science: Materials in Electronics > 2005 > 16 > 7 > 463-467
Journal of Materials Science: Materials in Electronics > 2003 > 14 > 5-7 > 437-440
Journal of Materials Science: Materials in Electronics > 2003 > 14 > 5-7 > 451-454
The European Physical Journal B > 2003 > 34 > 3 > 257-263
Journal of Materials Science: Materials in Electronics > 2001 > 12 > 4-6 > 211-214