Search results for: Ming Liu
IEEE Electron Device Letters > 2015 > 36 > 6 > 555 - 557
2013 IEEE International Reliability Physics Symposium (IRPS) > 5A.6.1 - 5A.6.8
IEEE Journal of Solid-State Circuits > 2012 > 47 > 6 > 1344 - 1354
IEEE Electron Device Letters > 2015 > 36 > 6 > 555 - 557
2013 IEEE International Reliability Physics Symposium (IRPS) > 5A.6.1 - 5A.6.8
IEEE Journal of Solid-State Circuits > 2012 > 47 > 6 > 1344 - 1354