Search results for: Juin J Liou
IEEE Electron Device Letters > 2016 > 37 > 10 > 1311 - 1313
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 263 - 265
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 495 - 499
IEEE Electron Device Letters > 2015 > 36 > 11 > 1121 - 1123
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 606 - 614
2014 IEEE International Reliability Physics Symposium > EL.2.1 - EL.2.4
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2588 - 2594
IEEE Electron Device Letters > 2013 > 34 > 12 > 1491 - 1493
IEEE Electron Device Letters > 2012 > 33 > 11 > 1595 - 1597
IEEE Electron Device Letters > 2012 > 33 > 6 > 860 - 862
IEEE Electron Device Letters > 2012 > 33 > 10 > 1360 - 1362
2011 9th IEEE International Conference on ASIC > 256 - 258
IEEE Electron Device Letters > 2010 > 31 > 8 > 845 - 847