Search results for: C. Claeys
2011 International Reliability Physics Symposium > SE.4.1 - SE.4.4
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 130 - 141
Solid State Electronics > 2008 > 52 > 8 > 1115-1126
Solid State Electronics > 2008 > 52 > 5 > 801-807
Solid State Electronics > 2007 > 51 > 1 > 16-37