Search results for: C. Claeys
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 130 - 141
IEEE Transactions on Electron Devices > 2006 > 53 > 8 > 1815 - 1820
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 130 - 141
IEEE Transactions on Electron Devices > 2006 > 53 > 8 > 1815 - 1820