Search results for: Cher Ming Tan
Springer Series in Reliability Engineering > Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections > 113-130
Springer Series in Reliability Engineering > Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections > 5-38
Springer Series in Reliability Engineering > Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections > 73-112
Springer Series in Reliability Engineering > Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections > 131-145
Springer Series in Reliability Engineering
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 163 - 173
2014 IEEE International Reliability Physics Symposium > 5A.1.1 - 5A.1.9
Journal of Power Sources > 2014 > 255 > Complete > 423-430
Microelectronics Reliability > 2014 > 54 > 6-7 > 1150-1159
Microelectronics Reliability > 2014 > 54 > 6-7 > 1103-1108
Microelectronics Reliability > 2014 > 54 > 5 > 960-964
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 400 - 407
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 742 - 750
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 904 - 913
IEEE Transactions on Semiconductor Manufacturing > 2014 > 27 > 2 > 204 - 211