Search results for: M. Volmer
NATO Science Series II: Mathematics, Physics and Chemistry > Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials > Contributed papers > 449-456
CAS 2012 (International Semiconductor Conference) > 2 > 313 - 316
CAS 2012 (International Semiconductor Conference) > 1 > 165 - 168
2009 International Semiconductor Conference > 1 > 155 - 158
2008 International Semiconductor Conference > 1 > 159 - 162
Materials Science & Engineering B > 2008 > 152 > 1-3 > 72-75
Physica B: Physics of Condensed Matter > 2008 > 403 > 2-3 > 350-353
2006 International Semiconductor Conference > 1 > 231 - 234
Physica B: Physics of Condensed Matter > 2006 > 372 > 1-2 > 198-201
Journal of Physics and Chemistry of Solids > 2005 > 66 > 12 > 2277-2280
Clinical Biomechanics > 2004 > 19 > 3 > 263-269
Surface Science > 2001 > 482-485 > Part 2 > 1010-1014
Der Unfallchirurg > 2001 > 104 > 2 > 150-157
Thin Solid Films > 1999 > 343-344 > Complete > 218-221